In this presentation, the usefulness of global bibliometric data sources (structured Big Data) in analyzing the academic profession is tested. Limitations of bibliometric datasets in studying academic careers are explored and ongoing global studies are compared with ongoing national-level studies. The methodological choices and their implications are discussed, and new opportunities for how to study scientists globally are explored. Strengths and weaknesses of survey methodologies and bibliometrics using Big Data are compared.
Registration open at: https://eduhk.zoom.us/meeting/register/tJYqduihqz0pEtVIgswGvtKDz0DwtWwPaL2l
Biography
Professor Marek Kwiek is Director of the Institute for Advanced Studies and UNESCO Chair in Institutional Research and Higher Education Policy, AMU University of Poznan, Poland (www.cpp.amu.edu.pl). His research area is quantitative studies of science, with interests in globalization of science, global academic profession, and international research collaboration. He has published 230 papers and his recent monograph is Changing European Academics: A Comparative Study of Social Stratification, Work Patterns and Research Productivity (Routledge, 2019). His most recent invited seminars include Berkeley, Harvard, Stanford, Oxford, Beijing and Hong Kong. He spent three years at North American universities, including the University of Virginia, UC Berkeley, National Endowment for Democracy in Washington, DC, and McGill University. He was also a Fulbright New Century Scholar in higher education (2007-2008) and a Professorial Visiting Fellow at the UCL Institute of Education, London (2012-2013). Currently (2022-2023), he is a Visiting Researcher at the German Center for Higher Education Research and Science Studies (DZHW), Berlin. A Principal Investigator or country Team Leader in 25 international higher education research projects. An ordinary member of the European Academy of Sciences and Arts (EASA) in Salzburg and Academia Europaea in London. Contact: kwiekm@amu.edu.pl. Twitter: @Marek_Kwiek.